Research Article
Katsunori Sumi
Abstract
The Flourishing Scale (FS) and the Scale of Positive and Negative Experience (SPANE) are reliable, valid instruments used to assess aspects of well-being such as psychological flourishing and positive and negative feelings. The Japanese versions of these scales (FS-J and SPANE-J) have been shown to have adequate internal consistency and construct validity. Test-retest reliability of the Japanese versions, however, has not yet been assessed. Therefore, the purpose of this study was to assess the test-retest reliability of the Japanese versions. The temporal stability of the factor structure of the Japanese versions was also evaluated. The FS-J and SPANE-J data were collected from 336 Japanese college students in two sessions conducted one month apart. The participants completed the Japanese versions in both sessions. The results indicated acceptable test-retest reliability for the FS-J (0.87) and SPANE-J (0.57-0.60). Simultaneous confirmatory factor analysis supported the temporal stability of the hypothesized factor structures for the Japanese versions over the one-month interval.