Research Article
K. S. Chaudhari, Y. R. Toda, A
Abstract
Pb0.8In0.2Se thin films were prepared on glass substrate by vacuum evaporation technique at a pressure of 10-5 torr. The structural properties of films were evaluated by XRD, EDAX, and optical microscopy. The x ray diffraction analysis confirms that deposited films are polycrystalline having cubic structure. The grain size was 54.11 to 56.73 nm. The optical properties of the films was determined over the thickness range of 2500Ǻ and 3000 Ǻ. Optical direct and indirect band gaps were calculated. The estimated direct and indirect optical band gaps were 0.816 to 0.85 eV and 1.71 to 1.78 eV.