Research Article
Y. R. Toda, K. S. Chaudhari, A
Abstract
Thin films having different thicknesses of AlSb were deposited by thermal evaporation technique onto precleaned amorphous glass substrate. The structural properties of films were evaluated by XRD, TEM and optical microscopy. The optical band gap of the films was measured by using optical absorption spectra. It is found that AlSb is an indirect band gap material having value of 1.58 eV. The Photo Luminescence(PL)study of the films are also studied and it is observed that the peaks are obtained at 488.04, 517.29 and574.8nm shows that zero phonon transition of donor - acceptor pair recombination, where as additional bands corresponds to phonon replicas of the zero phonon DA recombination. The x ray diffraction analysis confirms that deposited films are polycrystalline having cubic structure. The grain size is found to be 10.75 nm.