Research Article
Nazar AS, Syed AA and Murra
Abstract
Zinc telluride (ZnTe) thin films were fabricated by thermal evaporation method on corning glass substrates. ZnTe thin films were doped with silver (Ag) by dipping in low concentrated solution (0.2 g/200 ml) of AgNO3 × H2O at room temperature. X-ray diffraction technique was used to investigate the structural behavior of ZnTe samples. Optical investigations were done by using spectrophotometer. Scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX) were used to analyze the surface and composition of the thin film samples respectively. Electrical investigations were done by using Van Der Pauw and Hall measurement system. It was found that prepared samples showed polycrystalline structure with <111> as preferred orientation. Optical study showed that with increasing thickness, grain size increased but optical transmission and energy band gap were decreased. It was observed that value of resistivity of these samples decreased with increasing thickness and Ag composition. The results were compared before and after Ag doping in ZnTe thin films samples for the solar cell applications.