Original Articles
Anil K Bajpaia, R Bhatta, R Ka
Abstract
Due to its high mass resolution and high sensitivity with low surface damage under static limit, ToF-SIMS has acquired great importance in the past few years. In complex systems where the films are made up of more than two polymers, it is quite difficult to identify image profiles with great contrast. In this paper, the comparative study of image profiles of poly-(diamino naphthalene) (PDAN) doped poly-(vinyl alcohol) (PVA), monomer doped PVA and pure PVA films have been studied. Without much higher consideration of parameter “static limit”, the image profiling of all three films with higher resolution are obtained with ToF-SIMS technique. The image profiling results show that for going towards higher mass species, the intensity i.e. contrast of images decreases as well as the ions count also decreases. The primary ion dose of the ion beam from ToF-SIMS becomes 62.25, which is under limit to avoid surface damages.