Research Article
S. Sivananthan , N. Neelakand
Abstract
Single crystals of pure and ZnS doped halides for different values of x were grown by slow evaporation technique. All the grown crystals were characterised by XRD patterns. The elemental analysis was made from the EDAX data. Microhardness measurements have been carried out using Zwick hardness tester fitted with a Vicker Diamond Pyramidal indenter. The results obtained are discussed