Research Article
Norimitsu Ichikawa, Kota Us
Abstract
Electronic device may malfunction owing to electrostatically induced voltages. Malfunctions or failures can occurbecause of induced voltages in the range of 10 V. Charged human bodies can occasionally reach as high as 10 kVin offices. When such an object moves near the metal housing of electronic device, a high induced voltage canoccasionally be generated in the case. In experiments, the induced voltages in two metal cases are measured usingtwo spark gaps and two electromagnetic wave sensors when the charged object moves away from the metal caseand passes by another case. The results will be helpful in the consideration of preventive measures for electronicdevice.