Research Article
A. K. Ghatage, S. H. Tamboli,
Abstract
The electrical resistivity and seebeck coefficient measurements are carried out as a function of temperature for the system Ni0.5+xZn0.5TixFe2-2xO4 with x = 0.0, 0.2, 0.4 and 0.5. The lattice constants of the phases are evaluated from x-ray diffraction data. It is observed that the sample with x = 0 show n-type where as remaining samples show p-type at room temperature. The n-p transition takes place for the samples with x = 0.2 at 375 k and for 0.4 at 475 K and the conduction mechanism is associated with the polaron hopping.