Review Article
T Sankar, Potharaju Raju, Aras
Abstract
The halogen atoms (F, Br and Cl) substituted in epoxy compounds which were crystallized in slow evaporation method. Crystallographic data were collected by using BRUKER SMART APEX II CCD detector diffractometer. All the three compounds were solved by direct methods and refined by F2 full matrix least squares method. Compounds I and III crystallizes in monoclinic crystal system P21/c space group, but compound II crystallize in Triclinic P? space group, respectively. The final R-factor of the three compounds 0.0479, 0.0500 and 0.0787 respectively.